@mastersthesis{Ratnayake2021,author={Ratnayake, Kalana},title={Navigation Planning For A Multi Robot System Exploring An Unknown Environment Supported By Volumetric Data},address={Sri Lanka},month=dec,year={2021},school={University of Moratuwa, Faculty of Engineering},abbr={Master's Thesis},pdf={Navigation_Planning_For_A_Multi_Robot_System_Exploring_An_Unknown_Environment_Supported_By_Volumetric_Data.pdf},bibtex_show={true}}
National Patent
A Robotic Device for Autonomous Navigation in Unstructured Cluttered Environment
@patent{localPatentXavier,author={Ratnayake, Kalana and Gamage, Chandana and Sooriyaarachchi, Sulochana},address={Sri Lanka},title={A Robotic Device for Autonomous Navigation in Unstructured Cluttered Environment},nationality={Sri Lankan},number={LK/P/21836},dayfiled={28},monthfiled={Jun},yearfiled={2021},month=jun,year={2021},abbr={National Patent},bibtex_show={true}}
ICRAS 2021
OENS: An Octomap Based Exploration and Navigation System
@inproceedings{9476592,booktitle={2021 5th International Conference on Robotics and Automation Sciences (ICRAS)},author={Ratnayake, Kalana and Sooriyaarachchi, Sulochana and Gamage, Chandana},title={OENS: An Octomap Based Exploration and Navigation System},year={2021},pages={230-234},doi={10.1109/ICRAS52289.2021.9476592},abbr={ICRAS 2021},html={https://ieeexplore.ieee.org/document/9476592},bibtex_show={true}}
PCT Application
Method and Apparatus for Detecting Surface Defects
Sooriyaarachchi, Sulochana, Gamage, Chandana, De Silva, Chathura, Pallemulla, Sajith, Dharmaratna, Suresh, Ranathunga, Shashikala, Jayasena, Aruna, Ratnayake, Kalana, and Kahawala, Sachin
@patent{PCTFabVisSystem,author={Sooriyaarachchi, Sulochana and Gamage, Chandana and De Silva, Chathura and Pallemulla, Sajith and Dharmaratna, Suresh and Ranathunga, Shashikala and Jayasena, Aruna and Ratnayake, Kalana and Kahawala, Sachin},address={Sri Lanka},title={Method and Apparatus for Detecting Surface Defects},nationality={Sri Lankan},number={PCT/IB2021/052945},dayfiled={09},monthfiled={Apr},yearfiled={2021},month=apr,year={2021},abbr={PCT Application},bibtex_show={true}}
National Patent
Method and Apparatus for Detecting Surface Defects
Sooriyaarachchi, Sulochana, Gamage, Chandana, De Silva, Chathura, Pallemulla, Sajith, Dharmaratna, Suresh, Ranathunga, Shashikala, Jayasena, Aruna, Ratnayake, Kalana, and Kahawala, Sachin
@patent{localFabVisSystem,author={Sooriyaarachchi, Sulochana and Gamage, Chandana and De Silva, Chathura and Pallemulla, Sajith and Dharmaratna, Suresh and Ranathunga, Shashikala and Jayasena, Aruna and Ratnayake, Kalana and Kahawala, Sachin},address={Sri Lanka},title={Method and Apparatus for Detecting Surface Defects},nationality={Sri Lankan},number={LK/P/21709},dayfiled={09},monthfiled={April},yearfiled={2021},month=apr,year={2021},abbr={National Patent},bibtex_show={true}}